An X-ray diffractometer using mirage diffraction. Erratum

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An X-ray diffractometer using mirage diffraction. Erratum

Errors in the article by Fukamachi, Jongsukswat, Ju, Negishi, Hirano & Kawamura [J. Appl. Cryst. (2014), 47, 1267-1272] are corrected.[This corrects the article DOI: 10.1107/S1600576714012114.].

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An X-ray diffractometer using mirage diffraction

Some characteristics are reported of a triple-crystal diffractometer with a (+, -, +) setting of Si(220) using mirage diffraction. The first crystal is flat, while the second and third crystals are bent. Basically, the first crystal is used as a collimator, the second as a monochromator and the third as the sample. The third crystal also works as an analyzer. The advantages of this diffractomet...

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Strain distribution in an Si single crystal measured by interference fringes of X-ray mirage diffraction

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ژورنال

عنوان ژورنال: Journal of Applied Crystallography

سال: 2015

ISSN: 1600-5767

DOI: 10.1107/s1600576714026028